Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms.

Electromigration is the movement of atoms based on the flow of current through a material. If the current density is high enough, the heat dissipated within the material will repeatedly break atoms from the …

Electromigration is a potential wear-out failure mode for semiconductor devices utilizing metal conductors of inadequate cross-sectional area (too large of a current density)

Electromigration is defined as the phenomenon where metal atoms migrate due to the combined effects of high temperatures and electric current, resulting in issues such as voids and protrusions that can …

Jul 8, 2025 · Electromigration is a phenomenon that occurs in conductive materials, particularly in the metal interconnects used in semiconductor devices. It involves the gradual movement of metal atoms …

May 22, 2017 · This is because the interface between the copper line and capping layer is susceptible to electromigration. Prior to the 90nm node, IC makers generally used silicon nitride (SiN) as the …

Dec 24, 2024 · Electromigration (EM) is a key issue for electronic devices’ reliability and performance. We’ll look into what causes EM, the main factors that affect it, and how temperature and current …

Oct 13, 2024 · Electromigration (EM) is a phenomenon where metal ions in an interconnect get displaced due to the flow of electrons. You need to consider how this affects our circuit designs, …

Electromigration is a vital process in electronic devices affecting their reliability and lifespan. It involves the movement of metal atoms in response to electric currents.

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits.