Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...