The visual analog scale (VAS) demonstrates comparable validity for perennial allergic rhinitis (PAR) and nonallergic rhinitis ...
Abstract: As CMOS technology continues to scale, the associated reduction in device reliability margins has made accurate reliability evaluation a critical component of digital circuit design.
Tian, Y. (2025) Artificial Intelligence Acceptance of High School English Teachers and Its Influencing Factors —Mixed Research Based on the UNESCO Framework for Teachers’ AI Competence. Open Journal ...
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